RF Characterization System

• 45 MHz to 50 GHz frequency (HP 8510C)
• The fastest sweep mode available for any network analyzer
• Line-Reflect-Match calibration for on-wafer and in-fixture applications
• Internal "adapter removal" feature for measuring noninsertable devices with exceptional accuracy
• Test Set(8517B), Modular DC Source(4142B), Bias System(11612B11,11612B-K21,...),RF Probe Station

DC, C-V and Low Frequency measurement System.

• Semiconductor Parameter Analyzer(HP 4155A)
• Pulse generator Expander(HP41501A)
• Function Generator(Agilent 33250A)
• Graphics Plotter(HP7550A)

Photo-Detector Characterization System.

• DSP Lock-in Amplifier
• Short Pulse Fiber Laser
• Laser Diode Driver
• Optical Chopper